Abstract
A conductive composite film of LaNiO3 containing 36.1 at.% Pt was fabricated by radiofrequency co-sputtering. The film consists of two individual phases of separated LaNiO3 and Pt. X-ray diffraction, X-ray photoelectron spectroscopy and high-resolution transmission electron microscopy analysis reveal a net-like nanostructure characterized by 5 nm Pt grains embedded in the LaNiO3 matrix. Temperature-dependent resistivity measurement indicates a weak electron-phonon interaction and strong electron-electron scattering in the film. BaTiO3 film deposited on the composite film exhibits an increased remnant polarization due to release of interfacial charge accumulation, which indicates that the present conductive composite layer can be used as a promising electrode buffer layer in preparing ferroelectric film devices. (C) 2009 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
| Original language | English |
|---|---|
| Pages (from-to) | 4109-4114 |
| Number of pages | 6 |
| Journal | Acta Materialia |
| Volume | 57 |
| Issue number | 14 |
| DOIs | |
| Publication status | Published - 2009 |
Keywords
- Sputtering
- High-resolution electron microscopy (HREM)
- Nanostructure
- Ferroelectricity
- Ceramic matrix composites (CMC)
- MIST PLASMA EVAPORATION
- THIN-FILMS
- LOW-TEMPERATURE
- METALORGANIC
- DECOMPOSITION
- TRANSPORT-PROPERTIES
- LANIO3-DELTA FILMS
- METALLIC
- LANIO3
- BARIUM-TITANATE
- BATIO3 FILMS
- RNIO3 R