New considerations for exit wavefunction restoration under aberration corrected conditions

SJ Haigh, L-Y Chang, H Sawada, NP Young, AI Kirkland

Research output: Chapter in Book/Conference proceeding › Chapter

Original language	English
Title of host publication	EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
Publisher	Springer Nature
Pages	765-766
Number of pages	2
ISBN (Print)	3540851542
Publication status	Published - 2008

Cite this

@inbook{81dff456ccec4fbea531a785488b79b5,

title = "New considerations for exit wavefunction restoration under aberration corrected conditions",

author = "SJ Haigh and L-Y Chang and H Sawada and NP Young and AI Kirkland",

year = "2008",

language = "English",

isbn = "3540851542",

pages = "765--766",

booktitle = "EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany",

publisher = "Springer Nature",

address = "United States",

}