Abstract
Results obtained for the first time using Ga2S3 and Ga2Se3 compounds as sources of donor elements for the molecular beam epitaxy of AlxGa1-xSb (0 ≤ x ≤ 1 ) and AlxGa1-xAs (0 ≤ x ≤ 0·4) are reported. In GaAs, free electron concentrations obtained when incorporating the donors from these sources can be readily controlled up to a maximum of 5 × 1018 cm-3. For AlxGa1-xSb it was possible to compensate the high concentration of native acceptors and obtain n type conductivity over the full composition range of the alloy. In AlxGa1-xSb donor related defects (DX centres) were observed.
Original language | English |
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Pages (from-to) | 193-195 |
Number of pages | 3 |
Journal | Materials Science and Technology |
Volume | 12 |
Issue number | 2 |
Publication status | Published - 1 Feb 1996 |