NimbleAI: Towards Neuromorphic Sensing-Processing 3D-integrated Chips

Xabier Iturbe; Nassim Abderrahmane; Jaume Abella; Sergi Alcaide; Eric Beyne; Henri-Pierre Charles; Christelle Charpin-Nicolle; Lars Chittka; Angélica Dávila; Arne Erdmann; Carles Estrada; Ander Fernández; Anna Fontanelli; José Flich; Gianluca Furano; Alejandro Hernán Gloriani; Erik Isusquiza; Radu Grosu; Carles Hernández; Daniele Ielmini; David Jackson; Maha Kooli; Nicola Lepri; Bernabé Linares-Barranco; Jean-Loup Lachese; Eric Laurent; Menno Lindwer; Frank Linsenmaier; Mikel Luján; Karel Masařík; Nele Mentens; Orlando Moreira; Chinmay Nawghane; Luca Peres; Jean-Philippe Noel; Arash Pourtaherian; Christoph Posch; Peter Priller; Zdenek Prikryl; Felix Resch; Oliver Rhodes; Todor Stefanov; Moritz Storring; Michele Taliercio; Rafael Tornero; Marcel van de Burgwal; Geert van der Plas; Elisa Vianello; Pavel Zaykov

doi:10.23919/date56975.2023.10136952

NimbleAI: Towards Neuromorphic Sensing-Processing 3D-integrated Chips

Xabier Iturbe, Nassim Abderrahmane, Jaume Abella, Sergi Alcaide, Eric Beyne, Henri-Pierre Charles, Christelle Charpin-Nicolle, Lars Chittka, Angélica Dávila, Arne Erdmann, Carles Estrada, Ander Fernández, Anna Fontanelli, José Flich, Gianluca Furano, Alejandro Hernán Gloriani, Erik Isusquiza, Radu Grosu, Carles Hernández, Daniele IelminiDavid Jackson, Maha Kooli, Nicola Lepri, Bernabé Linares-Barranco, Jean-Loup Lachese, Eric Laurent, Menno Lindwer, Frank Linsenmaier, Mikel Luján, Karel Masařík, Nele Mentens, Orlando Moreira, Chinmay Nawghane, Luca Peres, Jean-Philippe Noel, Arash Pourtaherian, Christoph Posch, Peter Priller, Zdenek Prikryl, Felix Resch, Oliver Rhodes, Todor Stefanov, Moritz Storring, Michele Taliercio, Rafael Tornero, Marcel van de Burgwal, Geert van der Plas, Elisa Vianello, Pavel Zaykov

Advanced Processor Technology

Research output: Chapter in Book/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
DOIs	https://doi.org/10.23919/date56975.2023.10136952
Publication status	Published - Apr 2023

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10.23919/date56975.2023.10136952

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Iturbe, X., Abderrahmane, N., Abella, J., Alcaide, S., Beyne, E., Charles, H.-P., Charpin-Nicolle, C., Chittka, L., Dávila, A., Erdmann, A., Estrada, C., Fernández, A., Fontanelli, A., Flich, J., Furano, G., Gloriani, A. H., Isusquiza, E., Grosu, R., Hernández, C., ... Zaykov, P. (2023). NimbleAI: Towards Neuromorphic Sensing-Processing 3D-integrated Chips. In 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) https://doi.org/10.23919/date56975.2023.10136952

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title = "NimbleAI: Towards Neuromorphic Sensing-Processing 3D-integrated Chips",

author = "Xabier Iturbe and Nassim Abderrahmane and Jaume Abella and Sergi Alcaide and Eric Beyne and Henri-Pierre Charles and Christelle Charpin-Nicolle and Lars Chittka and Ang{\'e}lica D{\'a}vila and Arne Erdmann and Carles Estrada and Ander Fern{\'a}ndez and Anna Fontanelli and Jos{\'e} Flich and Gianluca Furano and Gloriani, {Alejandro Hern{\'a}n} and Erik Isusquiza and Radu Grosu and Carles Hern{\'a}ndez and Daniele Ielmini and David Jackson and Maha Kooli and Nicola Lepri and Bernab{\'e} Linares-Barranco and Jean-Loup Lachese and Eric Laurent and Menno Lindwer and Frank Linsenmaier and Mikel Luj{\'a}n and Karel Masa{\v r}{\'i}k and Nele Mentens and Orlando Moreira and Chinmay Nawghane and Luca Peres and Jean-Philippe Noel and Arash Pourtaherian and Christoph Posch and Peter Priller and Zdenek Prikryl and Felix Resch and Oliver Rhodes and Todor Stefanov and Moritz Storring and Michele Taliercio and Rafael Tornero and {van de Burgwal}, Marcel and {van der Plas}, Geert and Elisa Vianello and Pavel Zaykov",

year = "2023",

month = apr,

doi = "10.23919/date56975.2023.10136952",

language = "English",

booktitle = "2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)",

}

Iturbe, X, Abderrahmane, N, Abella, J, Alcaide, S, Beyne, E, Charles, H-P, Charpin-Nicolle, C, Chittka, L, Dávila, A, Erdmann, A, Estrada, C, Fernández, A, Fontanelli, A, Flich, J, Furano, G, Gloriani, AH, Isusquiza, E, Grosu, R, Hernández, C, Ielmini, D, Jackson, D, Kooli, M, Lepri, N, Linares-Barranco, B, Lachese, J-L, Laurent, E, Lindwer, M, Linsenmaier, F, Luján, M, Masařík, K, Mentens, N, Moreira, O, Nawghane, C, Peres, L, Noel, J-P, Pourtaherian, A, Posch, C, Priller, P, Prikryl, Z, Resch, F, Rhodes, O, Stefanov, T, Storring, M, Taliercio, M, Tornero, R, van de Burgwal, M, van der Plas, G, Vianello, E & Zaykov, P 2023, NimbleAI: Towards Neuromorphic Sensing-Processing 3D-integrated Chips. in 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE). https://doi.org/10.23919/date56975.2023.10136952

TY - GEN

T1 - NimbleAI: Towards Neuromorphic Sensing-Processing 3D-integrated Chips

AU - Iturbe, Xabier

AU - Abderrahmane, Nassim

AU - Abella, Jaume

AU - Alcaide, Sergi

AU - Beyne, Eric

AU - Charles, Henri-Pierre

AU - Charpin-Nicolle, Christelle

AU - Chittka, Lars

AU - Dávila, Angélica

AU - Erdmann, Arne

AU - Estrada, Carles

AU - Fernández, Ander

AU - Fontanelli, Anna

AU - Flich, José

AU - Furano, Gianluca

AU - Gloriani, Alejandro Hernán

AU - Isusquiza, Erik

AU - Grosu, Radu

AU - Hernández, Carles

AU - Ielmini, Daniele

AU - Jackson, David

AU - Kooli, Maha

AU - Lepri, Nicola

AU - Linares-Barranco, Bernabé

AU - Lachese, Jean-Loup

AU - Laurent, Eric

AU - Lindwer, Menno

AU - Linsenmaier, Frank

AU - Luján, Mikel

AU - Masařík, Karel

AU - Mentens, Nele

AU - Moreira, Orlando

AU - Nawghane, Chinmay

AU - Peres, Luca

AU - Noel, Jean-Philippe

AU - Pourtaherian, Arash

AU - Posch, Christoph

AU - Priller, Peter

AU - Prikryl, Zdenek

AU - Resch, Felix

AU - Rhodes, Oliver

AU - Stefanov, Todor

AU - Storring, Moritz

AU - Taliercio, Michele

AU - Tornero, Rafael

AU - van de Burgwal, Marcel

AU - van der Plas, Geert

AU - Vianello, Elisa

AU - Zaykov, Pavel

PY - 2023/4

Y1 - 2023/4

UR - http://dx.doi.org/10.23919/date56975.2023.10136952

U2 - 10.23919/date56975.2023.10136952

DO - 10.23919/date56975.2023.10136952

M3 - Conference contribution

BT - 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)

ER -

NimbleAI: Towards Neuromorphic Sensing-Processing 3D-integrated Chips

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