Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images

Andrew B. Yankovich; Chenyu Zhang; Albert Oh; Thomas J A Slater; Feridoon Azough; Robert Freer; Sarah J. Haigh; Rebecca Willett; Paul M. Voyles

doi:10.1088/0957-4484/27/36/364001

Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images

Andrew B. Yankovich, Chenyu Zhang, Albert Oh, Thomas J A Slater, Feridoon Azough, Robert Freer, Sarah J. Haigh, Rebecca Willett, Paul M. Voyles^*

^*Corresponding author for this work

University of Wisconsin Madison

Research output: Contribution to journal › Article › peer-review

Abstract

Image registration and non-local Poisson principal component analysis (PCA) denoising improve the quality of characteristic x-ray (EDS) spectrum imaging of Ca-stabilized Nd_2/3TiO₃ acquired at atomic resolution in a scanning transmission electron microscope. Image registration based on the simultaneously acquired high angle annular dark field image significantly outperforms acquisition with a long pixel dwell time or drift correction using a reference image. Non-local Poisson PCA denoising reduces noise more strongly than conventional weighted PCA while preserving atomic structure more faithfully. The reliability of and optimal internal parameters for non-local Poisson PCA denoising of EDS spectrum images is assessed using tests on phantom data.

Original language	English
Article number	364001
Journal	Nanotechnology
Volume	27
Issue number	36
DOIs	https://doi.org/10.1088/0957-4484/27/36/364001
Publication status	Published - 1 Aug 2016

Keywords

image denoising
multivariate statistical analysis
nano characterization
spectrum imaging

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10.1088/0957-4484/27/36/364001

Cite this

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title = "Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images",

abstract = "Image registration and non-local Poisson principal component analysis (PCA) denoising improve the quality of characteristic x-ray (EDS) spectrum imaging of Ca-stabilized Nd2/3TiO3 acquired at atomic resolution in a scanning transmission electron microscope. Image registration based on the simultaneously acquired high angle annular dark field image significantly outperforms acquisition with a long pixel dwell time or drift correction using a reference image. Non-local Poisson PCA denoising reduces noise more strongly than conventional weighted PCA while preserving atomic structure more faithfully. The reliability of and optimal internal parameters for non-local Poisson PCA denoising of EDS spectrum images is assessed using tests on phantom data.",

keywords = "image denoising, multivariate statistical analysis, nano characterization, spectrum imaging",

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year = "2016",

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doi = "10.1088/0957-4484/27/36/364001",

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T1 - Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images

AU - Yankovich, Andrew B.

AU - Zhang, Chenyu

AU - Oh, Albert

AU - Slater, Thomas J A

AU - Azough, Feridoon

AU - Freer, Robert

AU - Haigh, Sarah J.

AU - Willett, Rebecca

AU - Voyles, Paul M.

PY - 2016/8/1

Y1 - 2016/8/1

N2 - Image registration and non-local Poisson principal component analysis (PCA) denoising improve the quality of characteristic x-ray (EDS) spectrum imaging of Ca-stabilized Nd2/3TiO3 acquired at atomic resolution in a scanning transmission electron microscope. Image registration based on the simultaneously acquired high angle annular dark field image significantly outperforms acquisition with a long pixel dwell time or drift correction using a reference image. Non-local Poisson PCA denoising reduces noise more strongly than conventional weighted PCA while preserving atomic structure more faithfully. The reliability of and optimal internal parameters for non-local Poisson PCA denoising of EDS spectrum images is assessed using tests on phantom data.

AB - Image registration and non-local Poisson principal component analysis (PCA) denoising improve the quality of characteristic x-ray (EDS) spectrum imaging of Ca-stabilized Nd2/3TiO3 acquired at atomic resolution in a scanning transmission electron microscope. Image registration based on the simultaneously acquired high angle annular dark field image significantly outperforms acquisition with a long pixel dwell time or drift correction using a reference image. Non-local Poisson PCA denoising reduces noise more strongly than conventional weighted PCA while preserving atomic structure more faithfully. The reliability of and optimal internal parameters for non-local Poisson PCA denoising of EDS spectrum images is assessed using tests on phantom data.

KW - image denoising

KW - multivariate statistical analysis

KW - nano characterization

KW - spectrum imaging

UR - https://www.scopus.com/pages/publications/84988369528

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DO - 10.1088/0957-4484/27/36/364001

M3 - Article

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SN - 0957-4484

VL - 27

JO - Nanotechnology

JF - Nanotechnology

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ER -

Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images

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Next Generation Multi-Dimensional X-ray Imaging

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Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images

Abstract

Keywords

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Next Generation Multi-Dimensional X-ray Imaging

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