Non-Technical Loss Detection using Missing Values' Pattern

Jun Yang, Ke Fei, Fajuan Ren, Qi Li*, Jiajun Li, Yishu Duan, Lina Dong

*Corresponding author for this work

Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

Abstract

Non-Technical loss (NTL) has gradually become a threat of the continuous stability of power supply, and is of great significance to social production and people's lives. Electricity theft not only brings losses to the power supply company, but also reduces the quality of power supply. The wide application of advanced metering infrastructure (AMI) makes data-based electricity theft detection algorithms possible. The current data-based methods mainly focus on the feature of electricity consumption. This paper proposes a new feature data, the location information of missing values, and explores its relationship with electricity theft from the perspective of electricity theft means. Then, a convolutional neural network model is built and missing value location data was fitted. The good performance of this model confirms the close relationship between missing values and electricity theft. Finally, the specific missing value pattern is analyzed through the k-means clustering algorithm.

Original languageEnglish
Title of host publication2020 8th International Conference on Smart Grid and Clean Energy Technologies, ICSGCE 2020
PublisherIEEE
Pages149-154
Number of pages6
ISBN (Electronic)9781728157368
DOIs
Publication statusPublished - 4 Oct 2020
Event8th International Conference on Smart Grid and Clean Energy Technologies, ICSGCE 2020 - Virtual, Kuching, Malaysia
Duration: 4 Oct 20207 Oct 2020

Publication series

Name2020 8th International Conference on Smart Grid and Clean Energy Technologies, ICSGCE 2020

Conference

Conference8th International Conference on Smart Grid and Clean Energy Technologies, ICSGCE 2020
Country/TerritoryMalaysia
CityVirtual, Kuching
Period4/10/207/10/20

Keywords

  • AMI
  • CNN
  • electricity theft
  • Feature data
  • K-means

Fingerprint

Dive into the research topics of 'Non-Technical Loss Detection using Missing Values' Pattern'. Together they form a unique fingerprint.

Cite this