Nonlinearity measurement and analysis of 0.25 µm GaN HEMT over frequency and temperature using two-tone intermodulation distortion

Mohammad Abdul Alim, Ali Rezazadeh, Christophe Gaquiere, Mayahsa Mohammed Ali Abdul Hadi, Yongjian Zhang, Norshakila Haris, Peter Kyabaggu

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Fingerprint

    Dive into the research topics of 'Nonlinearity measurement and analysis of 0.25 µm GaN HEMT over frequency and temperature using two-tone intermodulation distortion'. Together they form a unique fingerprint.

    Engineering