Novel focused ion beam in-situ methods for stressed and cracked TEM sample preparation

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Original language	English
Pages (from-to)	487-488
Number of pages	2
Journal	European Microscopy Congress
DOIs	https://doi.org/10.1002/9783527808465.EMC2016.6963
Publication status	Published - 20 Dec 2016

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@article{c690929002b5424c8030a5f0586614df,

title = "Novel focused ion beam in-situ methods for stressed and cracked TEM sample preparation",

author = "Zhong, {X. L.} and Mcdonald, {S. A.} and P. Withers and M.g. Burke",

year = "2016",

month = dec,

day = "20",

doi = "10.1002/9783527808465.EMC2016.6963",

language = "English",

pages = "487--488",

journal = "European Microscopy Congress",

publisher = "European Microscopy Society",

}

TY - JOUR

T1 - Novel focused ion beam in-situ methods for stressed and cracked TEM sample preparation

AU - Zhong, X. L.

AU - Mcdonald, S. A.

AU - Withers, P.

AU - Burke, M.g.

PY - 2016/12/20

Y1 - 2016/12/20

U2 - 10.1002/9783527808465.EMC2016.6963

DO - 10.1002/9783527808465.EMC2016.6963

M3 - Conference article

SP - 487

EP - 488

JO - European Microscopy Congress

JF - European Microscopy Congress

ER -