Original language | English |
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Pages (from-to) | 487-488 |
Number of pages | 2 |
Journal | European Microscopy Congress |
DOIs | |
Publication status | Published - 20 Dec 2016 |
Novel focused ion beam in-situ methods for stressed and cracked TEM sample preparation
X. L. Zhong, S. A. Mcdonald, P. Withers, M.g. Burke
Research output: Contribution to journal › Conference article › peer-review
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