Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy

Michael W Anderson; Osamu Terasaki; Kanghee Cho; HuYoung Jeong; Shunsuke Asahina; Yusuke Sakuda; Mituo Suga; Masato Kudo; Takeshi Nokuo; Zheng Liu; Sam M Stevens; DianaCarolina GaleanoNunez; Ferdi Schuth; Tomas Kjellman; Viveka Alfredsson; Lu Han; Shunai Che; Hexiang Deng; Omar Yaghi; Ryong Ryoo

Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy

Michael W Anderson, Osamu Terasaki, Kanghee Cho, HuYoung Jeong, Shunsuke Asahina, Yusuke Sakuda, Mituo Suga, Masato Kudo, Takeshi Nokuo, Zheng Liu, Sam M Stevens, DianaCarolina GaleanoNunez, Ferdi Schuth, Tomas Kjellman, Viveka Alfredsson, Lu Han, Shunai Che, Hexiang Deng, Omar Yaghi, Ryong Ryoo

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	21-48
Number of pages	27
Journal	JEOL News
Volume	48
Publication status	Published - 2013

Cite this

Anderson, M. W., Terasaki, O., Cho, K., Jeong, H., Asahina, S., Sakuda, Y., Suga, M., Kudo, M., Nokuo, T., Liu, Z., Stevens, S. M., GaleanoNunez, D., Schuth, F., Kjellman, T., Alfredsson, V., Han, L., Che, S., Deng, H., Yaghi, O., & Ryoo, R. (2013). Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy. JEOL News, 48, 21-48.

@article{7cc07a87406f4288b80fae188f76b8ae,

title = "Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy",

author = "Anderson, {Michael W} and Osamu Terasaki and Kanghee Cho and HuYoung Jeong and Shunsuke Asahina and Yusuke Sakuda and Mituo Suga and Masato Kudo and Takeshi Nokuo and Zheng Liu and Stevens, {Sam M} and DianaCarolina GaleanoNunez and Ferdi Schuth and Tomas Kjellman and Viveka Alfredsson and Lu Han and Shunai Che and Hexiang Deng and Omar Yaghi and Ryong Ryoo",

year = "2013",

language = "English",

volume = "48",

pages = "21--48",

journal = "JEOL News",

publisher = "JEOL Ltd",

}

Anderson, MW, Terasaki, O, Cho, K, Jeong, H, Asahina, S, Sakuda, Y, Suga, M, Kudo, M, Nokuo, T, Liu, Z, Stevens, SM, GaleanoNunez, D, Schuth, F, Kjellman, T, Alfredsson, V, Han, L, Che, S, Deng, H, Yaghi, O & Ryoo, R 2013, 'Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy', JEOL News, vol. 48, pp. 21-48.

TY - JOUR

T1 - Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy

AU - Anderson, Michael W

AU - Terasaki, Osamu

AU - Cho, Kanghee

AU - Jeong, HuYoung

AU - Asahina, Shunsuke

AU - Sakuda, Yusuke

AU - Suga, Mituo

AU - Kudo, Masato

AU - Nokuo, Takeshi

AU - Liu, Zheng

AU - Stevens, Sam M

AU - GaleanoNunez, DianaCarolina

AU - Schuth, Ferdi

AU - Kjellman, Tomas

AU - Alfredsson, Viveka

AU - Han, Lu

AU - Che, Shunai

AU - Deng, Hexiang

AU - Yaghi, Omar

AU - Ryoo, Ryong

PY - 2013

Y1 - 2013

M3 - Article

VL - 48

SP - 21

EP - 48

JO - JEOL News

JF - JEOL News

ER -