Observations on the sensitivity of on-wafer cascode cell S-parameter measurements due to probing uncertainities

P Shinghal, R Sloan, C Duff, S Cochran

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Original languageEnglish
    Title of host publicationhost publication
    Place of PublicationPiscataway,
    PublisherIEEE
    Publication statusPublished - 6 Jun 2014
    Event83rd ARFTG Conference - Tampa Marriott Waterside Hotel, Tampa, Florida
    Duration: 6 Jun 20146 Jun 2014

    Conference

    Conference83rd ARFTG Conference
    CityTampa Marriott Waterside Hotel, Tampa, Florida
    Period6/06/146/06/14

    Keywords

    • On-wafer probing, cascode, UWB TWA design

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