On the roughness of single- and bi-layer graphene membranes

J. C. Meyer, A. K. Geim, M. I. Katsnelson, K. S. Novoselov, D. Obergfell, S. Roth, C. Girit, A. Zettl

    Research output: Contribution to journalArticlepeer-review

    Abstract

    We present a detailed transmission electron microscopy and electron diffraction study of the thinnest possible membrane, a single layer of carbon atoms suspended in vacuum and attached only at its edges. Membranes consisting of two graphene layers are also reported. We find that the membranes exhibit random microscopic curvature that is strongest in single-layer membranes. A direct visualization of the roughness is presented for two-layer membranes where we used the variation of diffracted intensities with the local orientation of the membrane. © 2007 Elsevier Ltd. All rights reserved.
    Original languageEnglish
    Pages (from-to)101-109
    Number of pages8
    JournalSolid State Communications
    Volume143
    Issue number1-2
    DOIs
    Publication statusPublished - Jul 2007

    Keywords

    • A. Thin films
    • B. Nanofabrication
    • C. Transmission electron microscopy
    • D. Mechanical properties

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