On the use of NEXAFS and PSID SEXAFS in the study of adsorbate- semiconductor coordination

D. Purdie, C. A. Muryn, N. S. Prakash, D. R. Warburton, G. Thornton, D. S. L.law

Research output: Contribution to journalArticlepeer-review

Abstract

Using Si(111)7*7-Cl as a model system, the authors have investigated the use of polarisation-dependent NEXAFS and ion yield SEXAFS in the determination of adsorbate-semiconductor coordination. Cl K-edge Cl+ yield data indicate a Cl-Si bond length of 2.01+or-0.03 AA, in agreement with Cl KLL Auger yield SEXAFS data. The polarisation-dependent behaviour of the 'white line' in Auger yield NEXAFS data is found to be consistent with a recently proposed pseudo-intra-molecular sigma *-resonance model.

Original languageEnglish
Article number069
Pages (from-to)SB265-SB266
JournalJournal of Physics: Condensed Matter
Volume1
DOIs
Publication statusPublished - 1989

Fingerprint

Dive into the research topics of 'On the use of NEXAFS and PSID SEXAFS in the study of adsorbate- semiconductor coordination'. Together they form a unique fingerprint.

Cite this