Optics of flat carbon-spectroscopic ellipsometry of graphene flakes

V. G. Kravets, R. R. Nair, P. Blake, L. A. Ponomarenko, I. Riaz, R. Jalil, S. Anisimova, A. N. Grigorenko, K. S. Novoselov, A. K. Geim

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    We present ellipsometric spectra of a graphene flake placed on a surface of oxidized silicon wafer. Our measurements demonstrate that spectroscopic ellipsometry can be successfully used to count the number of graphene layers in a flake. We also show that visible transparency of any two-dimensional system with a symmetric electronic spectrum is governed by the fine structure constant and derive an expression for the absorption coefficient of such a system. © 2011 Springer Science+Business Media B.V.
    Original languageEnglish
    Title of host publicationNATO Science for Peace and Security Series B: Physics and Biophysics|NAT Sci. Peace Serur. Ser. B Phys. Biophys.
    PublisherSpringer Nature
    Pages3-9
    Number of pages6
    ISBN (Print)9789400700437
    DOIs
    Publication statusPublished - 2011

    Publication series

    Name{NATO SECURITY THROUGH SCIENCE SERIES B: PHYSICS AND BIOPHYSICS}

    Keywords

    • absorption
    • graphene
    • spectra
    • spectroscopic ellipsometry

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