@inproceedings{9d091399a6f44124aa599ee8b5d09ed6,
title = "Optics of flat carbon-spectroscopic ellipsometry of graphene flakes",
abstract = "We present ellipsometric spectra of a graphene flake placed on a surface of oxidized silicon wafer. Our measurements demonstrate that spectroscopic ellipsometry can be successfully used to count the number of graphene layers in a flake. We also show that visible transparency of any two-dimensional system with a symmetric electronic spectrum is governed by the fine structure constant and derive an expression for the absorption coefficient of such a system. {\textcopyright} 2011 Springer Science+Business Media B.V.",
keywords = "absorption, graphene, spectra, spectroscopic ellipsometry",
author = "Kravets, {V. G.} and Nair, {R. R.} and P. Blake and Ponomarenko, {L. A.} and I. Riaz and R. Jalil and S. Anisimova and Grigorenko, {A. N.} and Novoselov, {K. S.} and Geim, {A. K.}",
note = "Conference of the NATO-ARW on Physical Properties of Nanosystems, Yalta, UKRAINE, SEP 28-OCT 02, 2009",
year = "2011",
doi = "10.1007/978-94-007-0044-4-1",
language = "English",
isbn = "9789400700437",
series = "{NATO SECURITY THROUGH SCIENCE SERIES B: PHYSICS AND BIOPHYSICS}",
publisher = "Springer Nature",
pages = "3--9",
booktitle = "NATO Science for Peace and Security Series B: Physics and Biophysics|NAT Sci. Peace Serur. Ser. B Phys. Biophys.",
address = "United States",
}