Optimized conditions for imaging the effects of bonding charge density in electron microscopy

J. Ciston; J. S. Kim; S. J. Haigh; A. I. Kirkland; L. D. Marks

doi:10.1016/j.ultramic.2010.12.003

Optimized conditions for imaging the effects of bonding charge density in electron microscopy

J. Ciston, J. S. Kim, S. J. Haigh, A. I. Kirkland, L. D. Marks

Research output: Contribution to journal › Article › peer-review

Abstract

We report on the observability of valence bonding effects in aberration-corrected high resolution electron microscopy (HREM) images along the [010] projection of the mineral Forsterite (Mg2SiO4). We have also performed exit wave restorations using simulated noisy images and have determined that both the intensities of individual images and the modulus of the restored complex exit wave are most sensitive to bonding effects at a level of 25% for moderately thick samples of 20-25nm. This relatively large thickness is due to dynamical amplification of bonding contrast arising from partial de-channeling of 1s states. Simulations also suggest that bonding contrast is similarly high for an un-corrected conventional electron microscope, implying an experimental limitation of signal to noise ratio rather than spatial resolution. © 2010 Elsevier B.V.

Original language	English
Pages (from-to)	901-911
Number of pages	10
Journal	Ultramicroscopy
Volume	111
Issue number	7
DOIs	https://doi.org/10.1016/j.ultramic.2010.12.003
Publication status	Published - Jun 2011

Keywords

Bonding
Charge density
HREM
Multislice

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http://www.sciencedirect.com/science/article/B6TW1-51P9TD4-1/2/f6f3d6a3f5fee1a605cfe3e89d125577

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@article{dd4aa90438f840fa837fd87f16a5e789,

title = "Optimized conditions for imaging the effects of bonding charge density in electron microscopy",

abstract = "We report on the observability of valence bonding effects in aberration-corrected high resolution electron microscopy (HREM) images along the [010] projection of the mineral Forsterite (Mg2SiO4). We have also performed exit wave restorations using simulated noisy images and have determined that both the intensities of individual images and the modulus of the restored complex exit wave are most sensitive to bonding effects at a level of 25% for moderately thick samples of 20-25nm. This relatively large thickness is due to dynamical amplification of bonding contrast arising from partial de-channeling of 1s states. Simulations also suggest that bonding contrast is similarly high for an un-corrected conventional electron microscope, implying an experimental limitation of signal to noise ratio rather than spatial resolution. {\textcopyright} 2010 Elsevier B.V.",

keywords = "Bonding, Charge density, HREM, Multislice",

author = "J. Ciston and Kim, {J. S.} and Haigh, {S. J.} and Kirkland, {A. I.} and Marks, {L. D.}",

note = "doi: DOI: 10.1016/j.ultramic.2010.12.003",

year = "2011",

month = jun,

doi = "10.1016/j.ultramic.2010.12.003",

language = "English",

volume = "111",

pages = "901--911",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier BV",

number = "7",

}

TY - JOUR

T1 - Optimized conditions for imaging the effects of bonding charge density in electron microscopy

AU - Ciston, J.

AU - Kim, J. S.

AU - Haigh, S. J.

AU - Kirkland, A. I.

AU - Marks, L. D.

N1 - doi: DOI: 10.1016/j.ultramic.2010.12.003

PY - 2011/6

Y1 - 2011/6

N2 - We report on the observability of valence bonding effects in aberration-corrected high resolution electron microscopy (HREM) images along the [010] projection of the mineral Forsterite (Mg2SiO4). We have also performed exit wave restorations using simulated noisy images and have determined that both the intensities of individual images and the modulus of the restored complex exit wave are most sensitive to bonding effects at a level of 25% for moderately thick samples of 20-25nm. This relatively large thickness is due to dynamical amplification of bonding contrast arising from partial de-channeling of 1s states. Simulations also suggest that bonding contrast is similarly high for an un-corrected conventional electron microscope, implying an experimental limitation of signal to noise ratio rather than spatial resolution. © 2010 Elsevier B.V.

AB - We report on the observability of valence bonding effects in aberration-corrected high resolution electron microscopy (HREM) images along the [010] projection of the mineral Forsterite (Mg2SiO4). We have also performed exit wave restorations using simulated noisy images and have determined that both the intensities of individual images and the modulus of the restored complex exit wave are most sensitive to bonding effects at a level of 25% for moderately thick samples of 20-25nm. This relatively large thickness is due to dynamical amplification of bonding contrast arising from partial de-channeling of 1s states. Simulations also suggest that bonding contrast is similarly high for an un-corrected conventional electron microscope, implying an experimental limitation of signal to noise ratio rather than spatial resolution. © 2010 Elsevier B.V.

KW - Bonding

KW - Charge density

KW - HREM

KW - Multislice

U2 - 10.1016/j.ultramic.2010.12.003

DO - 10.1016/j.ultramic.2010.12.003

M3 - Article

SN - 0304-3991

VL - 111

SP - 901

EP - 911

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 7

ER -

Optimized conditions for imaging the effects of bonding charge density in electron microscopy

Abstract

Keywords

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