Organic field-effect transistors with ultrathin gate insulator

Leszek Majewski, Raoul Schroeder, Martin Grell

    Research output: Contribution to journalArticlepeer-review

    Abstract

    We have used a commercially available Mylar film coated with a thin (≈60 nm) layer of aluminium and an ultrathin (≈3.5 nm) SiO2 layer as flexible substrate for the manufacture of bottom-gate organic field-effect transistors (OFETs).We show that the SiO2 layer has insulating properties with a breakdown voltage of 1.6V and a capacitance of ≈1F/cm2. We have manufactured organic field-effect transistors using this substrate, regioregular poly(3-hexylthiophene) (rrP3HT) as a p-type semiconductor, and gold source and drain contacts. This results in OFETs that operate with voltages on the order 1V.
    Original languageEnglish
    Pages (from-to)97-100
    Number of pages4
    JournalSynthetic Metals
    Volume144
    Publication statusPublished - 1 Apr 2004

    Keywords

    • Organic field-effect transistor (OFET)
    • Low voltage

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