Outlier detection using ball descriptions with adjustable metric

Elzbieta Pekalska, David M J Tax, Piotr Juszczak, Elzbieta Pȩkalska, Robert P W Duin

    Research output: Chapter in Book/Conference proceedingConference contribution

    Abstract

    Sometimes novel or outlier data has to be detected. The outliers may indicate some interesting rare event, or they should be disregarded because they cannot be reliably processed further. In the ideal case that the objects are represented by very good features, the genuine data forms a compact cluster and a good outlier measure is the distance to the cluster center. This paper proposes three new formulations to find a good cluster center together with an optimized ℓp-distance measure. Experiments show that for some real world datasets very good classification results are obtained and that, more specifically, the ℓ1-distance is particularly suited for datasets containing discrete feature values. © Springer-Verlag Berlin Heidelberg 2006.
    Original languageEnglish
    Title of host publicationLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)|Lect. Notes Comput. Sci.
    PublisherSpringer Nature
    Pages587-595
    Number of pages8
    Volume4109
    ISBN (Print)3540372369, 9783540372363
    DOIs
    Publication statusPublished - 2006
    EventJoint IAPR International Workshops on Structural, Syntactic, and Statistical Pattern Recognition, SSPR 2006 and SPR 2006 - Hong Kong
    Duration: 1 Jul 2006 → …
    http://dblp.uni-trier.de/db/conf/sspr/sspr2006.html#DuinP06http://dblp.uni-trier.de/rec/bibtex/conf/sspr/DuinP06.xmlhttp://dblp.uni-trier.de/rec/bibtex/conf/sspr/DuinP06

    Publication series

    NameLecture Notes in Computer Science

    Conference

    ConferenceJoint IAPR International Workshops on Structural, Syntactic, and Statistical Pattern Recognition, SSPR 2006 and SPR 2006
    CityHong Kong
    Period1/07/06 → …
    Internet address

    Keywords

    • ℓp- ball
    • One-class classification
    • Outlier detection
    • Robustness

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