Overall equipment effectiveness (OEE) and process capability (PC) measures: A relationship analysis

Jose Arturo Garza-Reyes, Steve Eldridge, Kevin D. Barber, Horacio Soriano-Meier

    Research output: Contribution to journal › Article › peer-review

    Fingerprint

    Dive into the research topics of 'Overall equipment effectiveness (OEE) and process capability (PC) measures: A relationship analysis'. Together they form a unique fingerprint.

    Economics, Econometrics and Finance

    Earth and Planetary Sciences

    Computer Science