Abstract
Peak fitting is one of the most commonly used post acquisition data analysis procedures in XPS, and also the most easily misused. Today the technique is being used in fields far removed from theoretical surface analysis and this volume attempts to encourage and help users from such fields to start out on processing their own data, and in particular to tackle the art of peak fitting, an essential skill in quantitative surface analysis.
| Original language | English |
|---|---|
| Place of Publication | Knutsford, UK |
| Publisher | Accolyte Science |
| ISBN (Print) | 978-0954953317 |
| Publication status | Published - 2010 |
Keywords
- XPS
- Peak Fitting