Abstract
The introduction of IEC61850 offers many advantages including interoperability and flexibility, and helps to reduce downtime that occurs as a result of upgrades that may be applied within a substation, due to technology changes. One application of IEC61850 is at the process level, where a Merging Unit samples the output of current and voltage transformers (CTs/VTs), and sends the standardized digitized output to the required protection and control devices. The design and development of a Merging Unit (MU) test system will be discussed. A number of performance tests will be carried out on the MU. © 2011 IEEE.
Original language | English |
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Title of host publication | APAP 2011 - Proceedings: 2011 International Conference on Advanced Power System Automation and Protection|APAP - Proc.: Int. Conf. Adv. Power Syst. Autom. Prot. |
Pages | 1252-1257 |
Number of pages | 5 |
Volume | 2 |
DOIs | |
Publication status | Published - 2011 |
Event | 2011 International Conference on Advanced Power System Automation and Protection - Beijing, China Duration: 16 Oct 2011 → 20 Oct 2011 |
Conference
Conference | 2011 International Conference on Advanced Power System Automation and Protection |
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Abbreviated title | APAP 2011 |
Country/Territory | China |
City | Beijing |
Period | 16/10/11 → 20/10/11 |
Keywords
- IEC61850 9-2 (LE)
- merging unit
- test system