Performance testing and assessment of Merging Units using IEC61850

Uzoamaka Anombem, Haiyu Li, Peter Crossley, Wen An, Ray Zhang, Craig Mctaggart

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    The introduction of IEC61850 offers many advantages including interoperability and flexibility, and helps to reduce downtime that occurs as a result of upgrades that may be applied within a substation, due to technology changes. One application of IEC61850 is at the process level, where a Merging Unit samples the output of current and voltage transformers (CTs/VTs), and sends the standardized digitized output to the required protection and control devices. The design and development of a Merging Unit (MU) test system will be discussed. A number of performance tests will be carried out on the MU. © 2011 IEEE.
    Original languageEnglish
    Title of host publicationAPAP 2011 - Proceedings: 2011 International Conference on Advanced Power System Automation and Protection|APAP - Proc.: Int. Conf. Adv. Power Syst. Autom. Prot.
    Pages1252-1257
    Number of pages5
    Volume2
    DOIs
    Publication statusPublished - 2011
    Event2011 International Conference on Advanced Power System Automation and Protection - Beijing, China
    Duration: 16 Oct 201120 Oct 2011

    Conference

    Conference2011 International Conference on Advanced Power System Automation and Protection
    Abbreviated titleAPAP 2011
    Country/TerritoryChina
    CityBeijing
    Period16/10/1120/10/11

    Keywords

    • IEC61850 9-2 (LE)
    • merging unit
    • test system

    Fingerprint

    Dive into the research topics of 'Performance testing and assessment of Merging Units using IEC61850'. Together they form a unique fingerprint.

    Cite this