Phase stability of zirconium oxide films during focused ion beam milling

Felicity Baxter; Alistair Garner; Matthew Topping; Helen Hulme; Michael Preuss; Philipp Frankel

doi:10.1016/j.jnucmat.2018.03.037

Phase stability of zirconium oxide films during focused ion beam milling

Felicity Baxter, Alistair Garner, Matthew Topping, Helen Hulme, Michael Preuss, Philipp Frankel

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Abstract

Focused ion beam (FIB) is a widely used technique for preparation of electron transparent samples and so it is vital to understand the potential for introduction of FIB-induced microstructural artefacts. The bombardment of both Xe+ and Ga+ ions is observed to cause extensive monoclinic to tetragonal phase transformation in ZrO2 corrosion films, however, this effect is diminished with reduced energy and is not observed below 5 KeV. This study emphasises the importance of careful FIB sample preparation with a low energy cleaning step, and also gives insight into the stabilisation mechanism of the tetragonal phase during oxidation.

Original language	English
Pages (from-to)	176-180
Number of pages	5
Journal	Journal of Nuclear Materials
Volume	504
Early online date	26 Mar 2018
DOIs	https://doi.org/10.1016/j.jnucmat.2018.03.037
Publication status	Published - Jun 2018

Keywords

Zirconium oxide
corrosion
Focused ion beam (FIB)
Transmission electron microscopy (TEM)
Electron backscatter diffraction (EBSD)

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10.1016/j.jnucmat.2018.03.037

Phase stability of zirconium oxide films Scripta_final draft_compressedAccepted author manuscript, 5.93 MB

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title = "Phase stability of zirconium oxide films during focused ion beam milling",

abstract = "Focused ion beam (FIB) is a widely used technique for preparation of electron transparent samples and so it is vital to understand the potential for introduction of FIB-induced microstructural artefacts. The bombardment of both Xe+ and Ga+ ions is observed to cause extensive monoclinic to tetragonal phase transformation in ZrO2 corrosion films, however, this effect is diminished with reduced energy and is not observed below 5 KeV. This study emphasises the importance of careful FIB sample preparation with a low energy cleaning step, and also gives insight into the stabilisation mechanism of the tetragonal phase during oxidation.",

keywords = "Zirconium oxide , corrosion, Focused ion beam (FIB), Transmission electron microscopy (TEM), Electron backscatter diffraction (EBSD)",

author = "Felicity Baxter and Alistair Garner and Matthew Topping and Helen Hulme and Michael Preuss and Philipp Frankel",

year = "2018",

month = jun,

doi = "10.1016/j.jnucmat.2018.03.037",

language = "English",

volume = "504",

pages = "176--180",

journal = "Journal of Nuclear Materials",

issn = "0022-3115",

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TY - JOUR

T1 - Phase stability of zirconium oxide films during focused ion beam milling

AU - Baxter, Felicity

AU - Garner, Alistair

AU - Topping, Matthew

AU - Hulme, Helen

AU - Preuss, Michael

AU - Frankel, Philipp

PY - 2018/6

Y1 - 2018/6

N2 - Focused ion beam (FIB) is a widely used technique for preparation of electron transparent samples and so it is vital to understand the potential for introduction of FIB-induced microstructural artefacts. The bombardment of both Xe+ and Ga+ ions is observed to cause extensive monoclinic to tetragonal phase transformation in ZrO2 corrosion films, however, this effect is diminished with reduced energy and is not observed below 5 KeV. This study emphasises the importance of careful FIB sample preparation with a low energy cleaning step, and also gives insight into the stabilisation mechanism of the tetragonal phase during oxidation.

AB - Focused ion beam (FIB) is a widely used technique for preparation of electron transparent samples and so it is vital to understand the potential for introduction of FIB-induced microstructural artefacts. The bombardment of both Xe+ and Ga+ ions is observed to cause extensive monoclinic to tetragonal phase transformation in ZrO2 corrosion films, however, this effect is diminished with reduced energy and is not observed below 5 KeV. This study emphasises the importance of careful FIB sample preparation with a low energy cleaning step, and also gives insight into the stabilisation mechanism of the tetragonal phase during oxidation.

KW - Zirconium oxide

KW - corrosion

KW - Focused ion beam (FIB)

KW - Transmission electron microscopy (TEM)

KW - Electron backscatter diffraction (EBSD)

U2 - 10.1016/j.jnucmat.2018.03.037

DO - 10.1016/j.jnucmat.2018.03.037

M3 - Article

SN - 0022-3115

VL - 504

SP - 176

EP - 180

JO - Journal of Nuclear Materials

JF - Journal of Nuclear Materials

ER -

Phase stability of zirconium oxide films during focused ion beam milling

Abstract

Keywords

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