Physical device modeling of a varactor diode

Alexander R. Masidlover, Andrew A P Gibson

    Research output: Contribution to journalArticlepeer-review


    Starting with the recipe for the fabrication process of a silicon p-n junction varactor diode, the semiconductor device equations are solved using the finite-element method. The capacitance of the reverse biased diode is extracted using the junction depletion width which is quantified by introducing a depletion factor. Validation of the complete modeling process is achieved by fabricating the diode, mounting it on a microwave circuit and comparing experimental scattering parameter data with those predicted by a circuit simulator with the imported physical model.
    Original languageEnglish
    Pages (from-to)722-725
    Number of pages3
    JournalIeee Transactions on Magnetics
    Issue number2
    Publication statusPublished - Mar 2004


    • Capacitance
    • Diodes
    • Finite-element methods
    • Parameter estimation


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