Piezospectroscopic analysis of the Pt-H2 complex in silicon

V. Kolkovski; O. Andersen; L. Dobaczewski; A. R. Peaker; K. Bonde Nielsen

doi:10.1016/j.physb.2003.09.164

Piezospectroscopic analysis of the Pt-H₂ complex in silicon

V. Kolkovski^*, O. Andersen, L. Dobaczewski, A. R. Peaker, K. Bonde Nielsen

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

Abstract

In this study the use of the high-resolution Laplace DLTS combined with uniaxial stress has allowed us to investigate in detail the structure and electrical properties of the platinum-hydrogen-related complex PtH₂. We correlate the defect electronic level with the results of other spectroscopic studies performed with electron paramagnetic resonance and far-infrared absorption measurements. The observed stress-induced peak splitting pattern confirms the orthorhombic-IC_2v symmetry of the complex. The re-orientation process of the defect can be observed at temperatures higher than the room temperature for all bias conditions.

Original language	English
Pages (from-to)	677-681
Number of pages	5
Journal	Physica B: Condensed Matter
Volume	340-342
DOIs	https://doi.org/10.1016/j.physb.2003.09.164
Publication status	Published - 31 Dec 2003
Event	Proceedings of the 22nd International Conference on Defects in (ICDS-22) - Aarhus, Denmark Duration: 28 Jul 2003 → 1 Aug 2003

Keywords

Laplace DLTS
Piezospectroscopy
Platinum-hydrogen complex

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10.1016/j.physb.2003.09.164

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@article{ee1d941c53414185aca68bfae091b0bd,

title = "Piezospectroscopic analysis of the Pt-H2 complex in silicon",

abstract = "In this study the use of the high-resolution Laplace DLTS combined with uniaxial stress has allowed us to investigate in detail the structure and electrical properties of the platinum-hydrogen-related complex PtH2. We correlate the defect electronic level with the results of other spectroscopic studies performed with electron paramagnetic resonance and far-infrared absorption measurements. The observed stress-induced peak splitting pattern confirms the orthorhombic-IC2v symmetry of the complex. The re-orientation process of the defect can be observed at temperatures higher than the room temperature for all bias conditions.",

keywords = "Laplace DLTS, Piezospectroscopy, Platinum-hydrogen complex",

author = "V. Kolkovski and O. Andersen and L. Dobaczewski and Peaker, {A. R.} and {Bonde Nielsen}, K.",

year = "2003",

month = dec,

day = "31",

doi = "10.1016/j.physb.2003.09.164",

language = "English",

volume = "340-342",

pages = "677--681",

journal = "Physica B: Condensed Matter",

issn = "0921-4526",

publisher = "Elsevier BV",

note = "Proceedings of the 22nd International Conference on Defects in (ICDS-22), ICDS-22 ; Conference date: 28-07-2003 Through 01-08-2003",

}

TY - JOUR

T1 - Piezospectroscopic analysis of the Pt-H2 complex in silicon

AU - Kolkovski, V.

AU - Andersen, O.

AU - Dobaczewski, L.

AU - Peaker, A. R.

AU - Bonde Nielsen, K.

PY - 2003/12/31

Y1 - 2003/12/31

N2 - In this study the use of the high-resolution Laplace DLTS combined with uniaxial stress has allowed us to investigate in detail the structure and electrical properties of the platinum-hydrogen-related complex PtH2. We correlate the defect electronic level with the results of other spectroscopic studies performed with electron paramagnetic resonance and far-infrared absorption measurements. The observed stress-induced peak splitting pattern confirms the orthorhombic-IC2v symmetry of the complex. The re-orientation process of the defect can be observed at temperatures higher than the room temperature for all bias conditions.

AB - In this study the use of the high-resolution Laplace DLTS combined with uniaxial stress has allowed us to investigate in detail the structure and electrical properties of the platinum-hydrogen-related complex PtH2. We correlate the defect electronic level with the results of other spectroscopic studies performed with electron paramagnetic resonance and far-infrared absorption measurements. The observed stress-induced peak splitting pattern confirms the orthorhombic-IC2v symmetry of the complex. The re-orientation process of the defect can be observed at temperatures higher than the room temperature for all bias conditions.

KW - Laplace DLTS

KW - Piezospectroscopy

KW - Platinum-hydrogen complex

UR - http://www.scopus.com/inward/record.url?scp=0346504168&partnerID=8YFLogxK

U2 - 10.1016/j.physb.2003.09.164

DO - 10.1016/j.physb.2003.09.164

M3 - Conference article

AN - SCOPUS:0346504168

SN - 0921-4526

VL - 340-342

SP - 677

EP - 681

JO - Physica B: Condensed Matter

JF - Physica B: Condensed Matter

T2 - Proceedings of the 22nd International Conference on Defects in (ICDS-22)

Y2 - 28 July 2003 through 1 August 2003

ER -

Piezospectroscopic analysis of the Pt-H₂ complex in silicon

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Keywords

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