Piezospectroscopic analysis of the Pt-H2 complex in silicon

V. Kolkovski, O. Andersen, L. Dobaczewski, A. R. Peaker, K. Bonde Nielsen

Research output: Contribution to journalConference articlepeer-review

Abstract

In this study the use of the high-resolution Laplace DLTS combined with uniaxial stress has allowed us to investigate in detail the structure and electrical properties of the platinum-hydrogen-related complex PtH2. We correlate the defect electronic level with the results of other spectroscopic studies performed with electron paramagnetic resonance and far-infrared absorption measurements. The observed stress-induced peak splitting pattern confirms the orthorhombic-IC2v symmetry of the complex. The re-orientation process of the defect can be observed at temperatures higher than the room temperature for all bias conditions.

Original languageEnglish
Pages (from-to)677-681
Number of pages5
JournalPhysica B: Condensed Matter
Volume340-342
DOIs
Publication statusPublished - 31 Dec 2003
EventProceedings of the 22nd International Conference on Defects in (ICDS-22) - Aarhus, Denmark
Duration: 28 Jul 20031 Aug 2003

Keywords

  • Laplace DLTS
  • Piezospectroscopy
  • Platinum-hydrogen complex

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