Powerful recombination centers resulting from reactions of hydrogen with carbon-oxygen defects in n-type Czocharlski-grown silicon

Michelle Vaqueiro Contreras, Vladimir Markevich, Matthew Halsall, Anthony Peaker, P Santos, J. Coutinho, S. Öberg, L. I. Murin, R Falster, J Binns, E. V. Monakhov, B. G. Svensson

    Research output: Contribution to journalArticlepeer-review

    Abstract

    It has been acknowledged for over 50 years that treatments with hydrogen can improve silicon semiconductor devices. In recent years these have been used to an advantage in silicon solar cells reducing the loss of photo-generated carriers at the silicon surface or at the silicon interface with dielectrics. However, we have found that in some types of silicon the in-diffusion of hydrogen can result in the
    formation of powerful recombination centers composed of carbon, oxygen and hydrogen which reduce the carrier lifetime and ultimately the efficiency of solar cells made from such material.
    Original languageEnglish
    Article number1700133
    Journalphysica status solidi (RRL) – Rapid Research Letters
    Volume11
    Issue number8
    Early online date27 Jun 2017
    DOIs
    Publication statusPublished - 18 Aug 2017

    Keywords

    • Czochralski silicon
    • Recombination center
    • Carbon-oxygen and hydrogen
    • MCTS

    Research Beacons, Institutes and Platforms

    • National Graphene Institute

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