@book{d1ac557df06d4962b80ebd73da8cc25a,
title = "Preparation and characterisation of exfoliated graphene for quantum resistance metrology",
abstract = "Exfoliated graphene samples have been prepared for use in quantum resistance metrology. Good progress is recently made in achieving contact resistances to graphene of less than 50 Ω. Details are presented on the handling and measurement of graphene samples. {\textcopyright}2010 IEEE.",
author = "G. Rietveld and \{Van Elferen\}, \{H. J.\} and Giesbers, \{A. J M\} and A. Veligura and U. Zeitler and Novoselov, \{K. S.\} and \{Van Wees\}, \{B. J.\} and Geim, \{A. K.\} and Maan, \{J. C.\}",
note = "Times Cited: 0 2010 Conference on Precision Electromagnetic Measurements Jun 13-18, 2010 Daejeon, SOUTH KOREA Ieee",
year = "2010",
doi = "10.1109/CPEM.2010.5544190",
language = "English",
isbn = "9781424467952",
series = "2010 Conference on Precision Electromagnetic Measurements Cpem",
publisher = "IEEE",
address = "United States",
}