Probing depth of total electron-yield XAS: Monte-Carlo simulations of auger electron trajectories

Sven Schroeder, S. L M Schroeder

    Research output: Contribution to journalArticlepeer-review

    Abstract

    The signal formation in total electron-yield (TEY) XAS has been modelled for keV absorption edges using a computationally fast Monte-Carlo algorithm for the simulation of the Auger electron trajectories. It is shown that a pure KLL Auger-yield model achieves good agreement with experimental data for the K-edge TEY attenuation in Al and Cu. Advantages of the Monte-Carlo simulation approach over empirical and analytical models for the TEY are pointed out.
    Original languageEnglish
    Pages (from-to)-153-C2
    JournalJournal de Physique IV
    Volume7
    Issue number2
    Publication statusPublished - 1997

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