Probing the nature of defects in graphene by Raman spectroscopy.

Axel Eckmann; Alexandre Felten; Artem Mishchenko; Liam Britnell; Ralph Krupke; Kostya S Novoselov; Cinzia Casiraghi

doi:10.1021/nl300901a

Probing the nature of defects in graphene by Raman spectroscopy.

Axel Eckmann, Alexandre Felten, Artem Mishchenko, Liam Britnell, Ralph Krupke, Kostya S Novoselov, Cinzia Casiraghi

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Abstract

Raman spectroscopy is able to probe disorder in graphene through defect-activated peaks. It is of great interest to link these features to the nature of disorder. Here we present a detailed analysis of the Raman spectra of graphene containing different type of defects. We found that the intensity ratio of the D and D' peak is maximum (???13) for sp(3)-defects, it decreases for vacancy-like defects (???7), and it reaches a minimum for boundaries in graphite (???3.5). This makes Raman Spectroscopy a powerful tool to fully characterize graphene.

Original language	English
Pages (from-to)	3925-30
Number of pages	3894
Journal	Nano Letters
Volume	12
Issue number	8
DOIs	https://doi.org/10.1021/nl300901a
Publication status	Published - Aug 2012

Keywords

conductive AFM
defects
Graphene
Raman spectroscopy

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@article{8407a4b611a84f0886b07c7129b22218,

title = "Probing the nature of defects in graphene by Raman spectroscopy.",

abstract = "Raman spectroscopy is able to probe disorder in graphene through defect-activated peaks. It is of great interest to link these features to the nature of disorder. Here we present a detailed analysis of the Raman spectra of graphene containing different type of defects. We found that the intensity ratio of the D and D' peak is maximum (???13) for sp(3)-defects, it decreases for vacancy-like defects (???7), and it reaches a minimum for boundaries in graphite (???3.5). This makes Raman Spectroscopy a powerful tool to fully characterize graphene.",

keywords = "conductive AFM, defects, Graphene, Raman spectroscopy",

author = "Axel Eckmann and Alexandre Felten and Artem Mishchenko and Liam Britnell and Ralph Krupke and Novoselov, {Kostya S} and Cinzia Casiraghi",

year = "2012",

month = aug,

doi = "10.1021/nl300901a",

language = "English",

volume = "12",

pages = "3925--30",

journal = "Nano Letters",

issn = "1530-6992",

publisher = "American Chemical Society",

number = "8",

}

TY - JOUR

T1 - Probing the nature of defects in graphene by Raman spectroscopy.

AU - Eckmann, Axel

AU - Felten, Alexandre

AU - Mishchenko, Artem

AU - Britnell, Liam

AU - Krupke, Ralph

AU - Novoselov, Kostya S

AU - Casiraghi, Cinzia

PY - 2012/8

Y1 - 2012/8

N2 - Raman spectroscopy is able to probe disorder in graphene through defect-activated peaks. It is of great interest to link these features to the nature of disorder. Here we present a detailed analysis of the Raman spectra of graphene containing different type of defects. We found that the intensity ratio of the D and D' peak is maximum (???13) for sp(3)-defects, it decreases for vacancy-like defects (???7), and it reaches a minimum for boundaries in graphite (???3.5). This makes Raman Spectroscopy a powerful tool to fully characterize graphene.

AB - Raman spectroscopy is able to probe disorder in graphene through defect-activated peaks. It is of great interest to link these features to the nature of disorder. Here we present a detailed analysis of the Raman spectra of graphene containing different type of defects. We found that the intensity ratio of the D and D' peak is maximum (???13) for sp(3)-defects, it decreases for vacancy-like defects (???7), and it reaches a minimum for boundaries in graphite (???3.5). This makes Raman Spectroscopy a powerful tool to fully characterize graphene.

KW - conductive AFM

KW - defects

KW - Graphene

KW - Raman spectroscopy

U2 - 10.1021/nl300901a

DO - 10.1021/nl300901a

M3 - Article

SN - 1530-6992

VL - 12

SP - 3925

EP - 3930

JO - Nano Letters

JF - Nano Letters

IS - 8

ER -

Probing the nature of defects in graphene by Raman spectroscopy.

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Keywords

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