'Programming' Electron Beam Ion Traps To Produce Atomic Data Relevant To Plasma Physics

Fred Currell, Brian O'Rourke, Anthony P. Kavanagh, Yueming Lie, Nobuyuki Nakamura, Shunsuke Ohtani, Hirofumi Watanabe

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

Abstract

After a brief review of the processes taking place in electron beam ions traps (EBITs), the means by which EBITs are used to make measurements of electron impact ionization cross‐sections and dielectronic recombination resonance strengths are discussed. In particular, results from a study involving holmium ions extracted from an electron beam ion trap are used to illustrate a technique for studying dielectronic recombination in open‐shell target ions.
Original languageEnglish
Title of host publicationATOMIC PROCESSES IN PLASMAS
Pages87-94
Number of pages8
Volume1161
DOIs
Publication statusPublished - 2009

Publication series

NameAIP Conference Proceedings

Keywords

  • Electron beam ion traps
  • highly charged ions
  • dielectronic recombination
  • electron impact ionization

Research Beacons, Institutes and Platforms

  • Dalton Nuclear Institute

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