@inbook{65e0c5349cb74ea593c833731a883821,
title = "'Programming' Electron Beam Ion Traps To Produce Atomic Data Relevant To Plasma Physics",
abstract = "After a brief review of the processes taking place in electron beam ions traps (EBITs), the means by which EBITs are used to make measurements of electron impact ionization cross‐sections and dielectronic recombination resonance strengths are discussed. In particular, results from a study involving holmium ions extracted from an electron beam ion trap are used to illustrate a technique for studying dielectronic recombination in open‐shell target ions.",
keywords = "Electron beam ion traps, highly charged ions, dielectronic recombination, electron impact ionization",
author = "Fred Currell and Brian O'Rourke and Kavanagh, {Anthony P.} and Yueming Lie and Nobuyuki Nakamura and Shunsuke Ohtani and Hirofumi Watanabe",
year = "2009",
doi = "10.1063/1.3241213",
language = "English",
isbn = "978-0-7354-0698-8",
volume = "1161",
series = "AIP Conference Proceedings",
pages = "87--94",
booktitle = "ATOMIC PROCESSES IN PLASMAS",
}