Properties of surface-pit related emission in a -plane InGaN/GaN quantum wells grown on r-plane sapphire

T. J. Badcock, R. Hao, M. A. Moram, P. Dawson, M. J. Kappers, C. J. Humphreys

    Research output: Contribution to journalArticlepeer-review

    Abstract

    We have investigated the optical and structural properties of non-polar (11-20) In0.03Ga0.97N/GaN multiple quantum wells (MQWs) grown on r-plane sapphire substrates. The emission spectrum is characterised by a peak at ~370 nm and a blue-green emission band (400-550 nm). The near-UV peak at 370 nm is assigned to carrier recombination in the MQWs lying on the (11-20) plane. On the basis of microscopy and cathodoluminescence imaging, the longer wavelength band is attributed to emission from sidewall MQWs formed on the various semi-polar facets of structural defects which form during MQW growth at the lower temperatures and high NH3 flow in a nitrogen atmosphere. The spectral width of this band is proposed to originate from electronic disorder within individual sidewall QWs and variations between the structural properties of QWs formed on different semi-polar facets. © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
    Original languageEnglish
    Pages (from-to)2179-2181
    Number of pages2
    JournalPhysica Status Solidi (C) Current Topics in Solid State Physics
    Volume8
    Issue number7-8
    DOIs
    Publication statusPublished - Jul 2011

    Keywords

    • A-plane
    • InGaN
    • QW
    • Surface pit

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