Quantification of hard X‐ray photoelectron spectroscopy: Calculating relative sensitivity factors for 1.5‐ to 10‐keV photons in any instrument geometry

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• Hard X-ray Photoelectron Spectroscopy (HAXPES)

  Spencer, B. (Senior Technical Specialist) & Flavell, W. (Academic lead)

  Faculty of Science and Engineering

  Facility/equipment: Facility

• Surface Characterisation

  Spencer, B. (Core Facility Lead), Nikiel, M. (Technical Specialist), Sheraz, S. (Technical Specialist), Li, K. (Technical Specialist), Dwyer, L. (Technical Specialist), Wall, S. (Technical Specialist), Williams, W. (Technical Specialist), Forrest, A. (Senior Technician), Fong, J. (Senior Technician), Filip, T. (Technician), Kundu, S. (Technical Specialist), Moore, K. (Academic lead), Walton, A. (Academic lead) & Lockyer, N. (Academic lead)

  FSE Research

  Facility/equipment: Facility