Quantification of Subsurface Damage in a Brittle Insulating Ceramic by Three-Dimensional Focused Ion Beam Tomography

Duncan Mcgrouther; N. Payraudeau; D. McGrouther; K. U. O&apos;Kelly

doi:10.1017/S1431927610094523

Quantification of Subsurface Damage in a Brittle Insulating Ceramic by Three-Dimensional Focused Ion Beam Tomography

Duncan Mcgrouther, N. Payraudeau, D. McGrouther, K. U. O'Kelly

Research output: Contribution to journal › Article › peer-review

Abstract

In this study, we present a fully automated method to investigate and reconstruct the three-dimensional crack structure beneath an indent in a highly insulating material. This work concentrates on issues arising from a long automatic acquisition process, the insulating nature of the specimen, and the introduction of minimal damage to the original cracks resulting from indentation.

Original language	English
Pages (from-to)	1-6
Number of pages	5
Journal	Microscopy and Microanalysis
DOIs	https://doi.org/10.1017/S1431927610094523
Publication status	Published - 4 Mar 2011

Keywords

focused ion beam (FIB) microscopy
crack
microstructure
ceramic
tomography

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10.1017/S1431927610094523

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title = "Quantification of Subsurface Damage in a Brittle Insulating Ceramic by Three-Dimensional Focused Ion Beam Tomography",

abstract = "In this study, we present a fully automated method to investigate and reconstruct the three-dimensional crack structure beneath an indent in a highly insulating material. This work concentrates on issues arising from a long automatic acquisition process, the insulating nature of the specimen, and the introduction of minimal damage to the original cracks resulting from indentation.",

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author = "Duncan Mcgrouther and N. Payraudeau and D. McGrouther and O'Kelly, {K. U.}",

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AU - Payraudeau, N.

AU - McGrouther, D.

AU - O'Kelly, K. U.

PY - 2011/3/4

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AB - In this study, we present a fully automated method to investigate and reconstruct the three-dimensional crack structure beneath an indent in a highly insulating material. This work concentrates on issues arising from a long automatic acquisition process, the insulating nature of the specimen, and the introduction of minimal damage to the original cracks resulting from indentation.

KW - focused ion beam (FIB) microscopy

KW - crack

KW - microstructure

KW - ceramic

KW - tomography

U2 - 10.1017/S1431927610094523

DO - 10.1017/S1431927610094523

M3 - Article

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SN - 1431-9276

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -

Quantification of Subsurface Damage in a Brittle Insulating Ceramic by Three-Dimensional Focused Ion Beam Tomography

Abstract

Keywords

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