Quantification of Subsurface Damage in a Brittle Insulating Ceramic by Three-Dimensional Focused Ion Beam Tomography

Duncan Mcgrouther, N. Payraudeau, D. McGrouther, K. U. O'Kelly

    Research output: Contribution to journalArticlepeer-review

    Abstract

    In this study, we present a fully automated method to investigate and reconstruct the three-dimensional crack structure beneath an indent in a highly insulating material. This work concentrates on issues arising from a long automatic acquisition process, the insulating nature of the specimen, and the introduction of minimal damage to the original cracks resulting from indentation.
    Original languageEnglish
    Pages (from-to)1-6
    Number of pages5
    JournalMicroscopy and Microanalysis
    DOIs
    Publication statusPublished - 4 Mar 2011

    Keywords

    • focused ion beam (FIB) microscopy
    • crack
    • microstructure
    • ceramic
    • tomography

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