Quantifying the dielectric constant of thick insulators by electrostatic force microscopy: effects of the microscopic parts of the probe

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Cite this

@article{f793dd5d414a4bc68ac89d9fc162ef6e,

title = "Quantifying the dielectric constant of thick insulators by electrostatic force microscopy: effects of the microscopic parts of the probe",

author = "G. Gramse and G Gomila and Laura Fumagalli",

year = "2012",

language = "English",

volume = "23",

pages = "205703",

journal = "Nanotechnology",

issn = "0957-4484",

publisher = "IOP Publishing Ltd",

}