Quantifying the dielectric constant of thick insulators using electrostatic force microscopy

Laura Fumagalli, G. Gramse, D. Esteban-Ferrer, M. A. Edwards, G Gomila

Research output: Contribution to journal › Article › peer-review

Cite this

@article{3d60fc75e5b74b65a9b5405f35621258,

title = "Quantifying the dielectric constant of thick insulators using electrostatic force microscopy",

author = "Laura Fumagalli and G. Gramse and D. Esteban-Ferrer and Edwards, {M. A.} and G Gomila",

year = "2010",

language = "English",

volume = "96",

pages = "183107",

journal = "Applied Physics Letters",

publisher = "American Institute of Physics",

}