Quantifying the dielectric constant of thick insulators using electrostatic force microscopy

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Cite this

@article{3d60fc75e5b74b65a9b5405f35621258,

title = "Quantifying the dielectric constant of thick insulators using electrostatic force microscopy",

author = "Laura Fumagalli and G. Gramse and D. Esteban-Ferrer and Edwards, \{M. A.\} and G Gomila",

year = "2010",

language = "English",

volume = "96",

pages = "183107",

journal = "Applied Physics Letters",

publisher = "American Institute of Physics",

}