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Quantitative analysis of saccharides by X-ray photoelectron spectroscopy

  • Joanna S. Stevens
  • , Sven L M Schroeder

    Research output: Contribution to journalArticlepeer-review

    Abstract

    Aseries of saccharides, including severalmonohydrates and one amorphous phase, hasbeen investigated by XPS, providing the first database of survey and high-resolution spectra for this class of compounds. Known stoichiometries and XPS-determined elemental compositions agree well. XPS has sufficient precision for distinguishing the stoichiometries of mono-, di-, and polysaccharides. The C 1s chemical shifts of the acetal and alcohol groups are similar for all samples, albeit with slight binding energy increases in the series from mono- to di- and polysaccharides. Increasing X-ray exposure causes a radiation-induced increase of the aliphatic hydrocarbon emission at 285 eV, concomitant with the appearance of a high binding energy C 1s emission peak at 289.1 eV and a decrease in the O 1s/C 1s emission intensity ratio. Formation of aliphatic hydrocarbon groups is proposed to arise from dehydroxylation,while the increase in the 289.1 eV peak can be attributed to double dehydroxylation at the C 1 position or partial oxidation of an alcohol or acetal group. The rate of radiation damage correlates with previously reported rates of thermally induced caramelization. © 2009 John Wiley & Sons, Ltd.
    Original languageEnglish
    Pages (from-to)453-462
    Number of pages9
    JournalSurface and Interface Analysis
    Volume41
    Issue number6
    DOIs
    Publication statusPublished - Jun 2009

    Keywords

    • Alcohol
    • Carbohydrate
    • Radiation damage
    • Saccharide
    • Sugar
    • XPS

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