Quantitative dielectric constant measurement of thin films by DC electrostatic force microscopy

G. Gramse, I Casuso, J Toset, Laura Fumagalli, G Gomila

Research output: Contribution to journal › Article › peer-review

Cite this

@article{57153d576a6e4a94bcf83d7c8e76dae2,

title = "Quantitative dielectric constant measurement of thin films by DC electrostatic force microscopy",

author = "G. Gramse and I Casuso and J Toset and Laura Fumagalli and G Gomila",

year = "2009",

language = "English",

volume = "20",

pages = "395702",

journal = "Nanotechnology",

issn = "0957-4484",

publisher = "IOP Publishing Ltd",

}