Quantitative electrostatic force microscopy with sharp silicon tips

L. Fumagalli, MA Edwards, G Gomila

    Research output: Contribution to journalArticlepeer-review

    Original languageEnglish
    Pages (from-to)495701
    JournalNanotechnology
    Volume25
    Issue number49
    DOIs
    Publication statusPublished - 12 Dec 2014

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