Original language | English |
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Pages (from-to) | 495701 |
Journal | Nanotechnology |
Volume | 25 |
Issue number | 49 |
DOIs | |
Publication status | Published - 12 Dec 2014 |
Quantitative electrostatic force microscopy with sharp silicon tips
L. Fumagalli, MA Edwards, G Gomila
Research output: Contribution to journal › Article › peer-review