Quantitative grain boundary analysis of bulk samples by SIMS

F Christien, C Downing, K L Moore, C R M Grovenor

    Research output: Contribution to journalArticlepeer-review

    Abstract

    Solute grain boundary (GB) segregation is an important metallurgical phenomenon that has been extensively studied over the last 40 years, especially by Auger spectroscopy of fractured surfaces. More recently, it has been demonstrated that high-resolution SIMS (NanoSIMS) analysis can detect solute GB segregation on a simple polished cross-section. The aim of the work presented here was to demonstrate the use of SIMS to achieve quantitative analysis of GB segregation, including taking into account the inclination of the individual boundaries to the bulk sample surface. Copyright © 2012 John Wiley & Sons, Ltd. Copyright © 2012 John Wiley & Sons, Ltd.
    Original languageEnglish
    Pages (from-to)305-308
    Number of pages4
    JournalSurface and Interface Analysis
    Volume45
    Issue number1
    DOIs
    Publication statusPublished - 2013

    Keywords

    • grain boundary
    • NanoSIMS
    • quantitative analysis
    • Auger spectroscopy
    • Bulk samples
    • Fractured surfaces
    • Grain boundary analysis
    • High resolution
    • Chemical analysis
    • Grain boundaries
    • Segregation (metallography)

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