Skip to main navigation Skip to search Skip to main content

Quantitative nanosims analysis of grain boundary segregation in bulk samples

  • F Christien
  • , C Downing
  • , K L Moore
  • , C R M Grovenor

    Research output: Chapter in Book/Conference proceeding › Conference contribution

    Abstract

    Solute grain boundary (GB) segregation is an important metallurgical phenomenon that has been extensively studied over the last 40 years, especially by Auger spectroscopy of fractured surfaces. More recently, it has been demonstrated that High Resolution SIMS (NanoSIMS) analysis can detect solute GB segregation on a simple polished cross-section. The aim of the work presented here is to demonstrate the use of SIMS to achieve quantitative analysis of GB segregation.
    Original languageEnglish
    Title of host publicationhost publication
    Pages265-271
    Number of pages7
    Volume1
    Publication statusPublished - 2012
    Event141st Annual Meeting and Exhibition, TMS 2012 - Orlando, FL, United States
    Duration: 11 Mar 2012 → 15 Mar 2012
    http://www.scopus.com/inward/record.url?eid=2-s2.0-84860865547&partnerID=40&md5=0bce687833020d9b73157a0c9ef5dfaa

    Conference

    Conference141st Annual Meeting and Exhibition, TMS 2012
    Country/TerritoryUnited States
    CityOrlando, FL
    Period11/03/12 → 15/03/12
    Internet address

    Keywords

    • Auger Electron Spectroscopy (AES)
    • Microbeam techniques
    • SIMS
    • Surface analysis
    • Traces
    • Auger spectroscopy
    • Bulk samples
    • Fractured surfaces
    • Grain boundary segregation
    • High resolution
    • Microbeam technique
    • NanoSIMS
    • Auger electron spectroscopy
    • Exhibitions
    • Grain boundaries
    • Lunar surface analysis
    • Secondary ion mass spectrometry
    • Segregation (metallography)

    Fingerprint

    Dive into the research topics of 'Quantitative nanosims analysis of grain boundary segregation in bulk samples'. Together they form a unique fingerprint.

    Cite this