Abstract
Solute grain boundary (GB) segregation is an important metallurgical phenomenon that has been extensively studied over the last 40 years, especially by Auger spectroscopy of fractured surfaces. More recently, it has been demonstrated that High Resolution SIMS (NanoSIMS) analysis can detect solute GB segregation on a simple polished cross-section. The aim of the work presented here is to demonstrate the use of SIMS to achieve quantitative analysis of GB segregation.
| Original language | English |
|---|---|
| Title of host publication | host publication |
| Pages | 265-271 |
| Number of pages | 7 |
| Volume | 1 |
| Publication status | Published - 2012 |
| Event | 141st Annual Meeting and Exhibition, TMS 2012 - Orlando, FL, United States Duration: 11 Mar 2012 → 15 Mar 2012 http://www.scopus.com/inward/record.url?eid=2-s2.0-84860865547&partnerID=40&md5=0bce687833020d9b73157a0c9ef5dfaa |
Conference
| Conference | 141st Annual Meeting and Exhibition, TMS 2012 |
|---|---|
| Country/Territory | United States |
| City | Orlando, FL |
| Period | 11/03/12 → 15/03/12 |
| Internet address |
Keywords
- Auger Electron Spectroscopy (AES)
- Microbeam techniques
- SIMS
- Surface analysis
- Traces
- Auger spectroscopy
- Bulk samples
- Fractured surfaces
- Grain boundary segregation
- High resolution
- Microbeam technique
- NanoSIMS
- Auger electron spectroscopy
- Exhibitions
- Grain boundaries
- Lunar surface analysis
- Secondary ion mass spectrometry
- Segregation (metallography)
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