Radiation hardness testing of an organic liquid scintillation detector for use in high dose rate accident response scenarios

Ashley Jones, Malcolm Joyce, Arron Griffiths, Barry Lennox, Dale Potts, Simon Watson, Jun-ichi Katakura, Keisuke Okumura, Kangsoo Kim, Michio Katoh, Kazuya Nishimura, Ken-ichi Sawada

    Research output: Chapter in Book/Conference proceedingConference contribution

    Abstract

    Organic liquid scintillation detectors offer the advantage relative to many alternatives that they are sensitive to both fast neutrons and gamma rays, whilst radiation type can be discerned on the basis of pulse-shape discrimination. Mixed radiation fields of this type can arise in the context of reactor accidents via, for example, 137Cs (gamma) and 244Cm (neutrons). However, performance degradation of such scintillators, such as EJ-301, is a significant possibility that might limit the use of this technology in accident response applications. The premise behind the high dose rate testing of such a liquid scintillator described in this paper is for fuel debris characterisation at Fukushima Daiichi, which has expected dose rates of up to 1000 Gy/hr in close proximity to fuel debris. The tests carried out for this investigation involved using the 60Co gamma irradiation facility at the Dalton Cumbria Facility, Cumbria, United Kingdom to expose the detector to a similar dose rate to that which is estimated within the primary containment vessel for survivability tests. Radiation hardness tests have rarely been reported for such devices and it is expected that the performance will be dependent on the survival of the window of the photomultiplier tube rather than the liquid scintillant itself. A major advantage of the use of this detector is its physical size, due to the limitations on access into Fukushima reactors physical space is a premium. The research described in this paper presents the results of the dose rate exposure of the detector before signal was lost with the total dose observed providing information on any degradation affecting the performance of the device post-irradiation.
    Original languageEnglish
    Title of host publicationHOTLAB 2016
    Publication statusPublished - Oct 2016

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