Rapid, substrate-independent thickness determination of large area graphene layers

Dinesh K Venkatachalam; Patrick Parkinson; Simon Ruffell; Robert G Elliman

doi:10.1063/1.3664633

Rapid, substrate-independent thickness determination of large area graphene layers

Dinesh K Venkatachalam, Patrick Parkinson, Simon Ruffell, Robert G Elliman

Research output: Contribution to journal › Article › peer-review

Abstract

Phase-shifting interferometric imaging is shown to be a powerful analytical tool for studying graphene films, providing quantitative analysis of large area samples with an optical thickness resolution of

Original language	English
Journal	Applied Physics Letters
Volume	99
Issue number	23
DOIs	https://doi.org/10.1063/1.3664633
Publication status	Published - 9 Dec 2011

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http://scitation.aip.org/content/aip/journal/apl/99/23/10.1063/1.3664633

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title = "Rapid, substrate-independent thickness determination of large area graphene layers",

abstract = "Phase-shifting interferometric imaging is shown to be a powerful analytical tool for studying graphene films, providing quantitative analysis of large area samples with an optical thickness resolution of",

author = "Venkatachalam, {Dinesh K} and Patrick Parkinson and Simon Ruffell and Elliman, {Robert G}",

year = "2011",

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AU - Ruffell, Simon

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N2 - Phase-shifting interferometric imaging is shown to be a powerful analytical tool for studying graphene films, providing quantitative analysis of large area samples with an optical thickness resolution of

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M3 - Article

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JO - Applied Physics Letters

JF - Applied Physics Letters

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Rapid, substrate-independent thickness determination of large area graphene layers

Abstract

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