Ray-trace calculations for in situ X-ray beam imaging

Nicholas R. Kyele; Roelof G. Van Silfhout

doi:10.1107/S0909049507029664

Ray-trace calculations for in situ X-ray beam imaging

Nicholas R. Kyele, Roelof G. Van Silfhout

Research output: Contribution to journal › Article › peer-review

Abstract

A two-dimensional beam-position and profile monitor for synchrotron X-ray beamlines was recently presented that was based on the principle of collection of scattered radiation from a thin polyimide foil. This paper presents a simple ray-trace model of the device, which can be used as a tool to calculate its response to changes in various device geometrical properties for a given beam size. The tool provides a quick way of predicting positional sensitivity, beam profile shape and intensity distribution. The theoretically obtained beam images are compared with data obtained from experiments carried out at the European Synchrotron Radiation Facility. © International Union of Crystallography 2007.

Original language	English
Pages (from-to)	439-445
Number of pages	6
Journal	Journal of Synchrotron Radiation
Volume	14
Issue number	5
DOIs	https://doi.org/10.1107/S0909049507029664
Publication status	Published - 10 Aug 2007

Keywords

Beam-position monitor
Beam-profile monitor
Ray tracing
X-rays

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title = "Ray-trace calculations for in situ X-ray beam imaging",

abstract = "A two-dimensional beam-position and profile monitor for synchrotron X-ray beamlines was recently presented that was based on the principle of collection of scattered radiation from a thin polyimide foil. This paper presents a simple ray-trace model of the device, which can be used as a tool to calculate its response to changes in various device geometrical properties for a given beam size. The tool provides a quick way of predicting positional sensitivity, beam profile shape and intensity distribution. The theoretically obtained beam images are compared with data obtained from experiments carried out at the European Synchrotron Radiation Facility. {\textcopyright} International Union of Crystallography 2007.",

keywords = "Beam-position monitor, Beam-profile monitor, Ray tracing, X-rays",

author = "Kyele, {Nicholas R.} and {Van Silfhout}, {Roelof G.}",

year = "2007",

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AU - Van Silfhout, Roelof G.

PY - 2007/8/10

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N2 - A two-dimensional beam-position and profile monitor for synchrotron X-ray beamlines was recently presented that was based on the principle of collection of scattered radiation from a thin polyimide foil. This paper presents a simple ray-trace model of the device, which can be used as a tool to calculate its response to changes in various device geometrical properties for a given beam size. The tool provides a quick way of predicting positional sensitivity, beam profile shape and intensity distribution. The theoretically obtained beam images are compared with data obtained from experiments carried out at the European Synchrotron Radiation Facility. © International Union of Crystallography 2007.

AB - A two-dimensional beam-position and profile monitor for synchrotron X-ray beamlines was recently presented that was based on the principle of collection of scattered radiation from a thin polyimide foil. This paper presents a simple ray-trace model of the device, which can be used as a tool to calculate its response to changes in various device geometrical properties for a given beam size. The tool provides a quick way of predicting positional sensitivity, beam profile shape and intensity distribution. The theoretically obtained beam images are compared with data obtained from experiments carried out at the European Synchrotron Radiation Facility. © International Union of Crystallography 2007.

KW - Beam-position monitor

KW - Beam-profile monitor

KW - Ray tracing

KW - X-rays

U2 - 10.1107/S0909049507029664

DO - 10.1107/S0909049507029664

M3 - Article

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SP - 439

EP - 445

JO - Journal of Synchrotron Radiation

JF - Journal of Synchrotron Radiation

IS - 5

ER -

Ray-trace calculations for in situ X-ray beam imaging

Abstract

Keywords

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