Real-time Automatic Thickness Recognition Using Pulse Eddy Current with Deep Learning

Tian Meng, Lei Xiong, Xinnan Zheng, Zihan Xia, Xiaofei Liu, Yang Tao, Wuqiang Yang, Wuliang Yin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Original languageEnglish
Title of host publication2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
DOIs
Publication statusPublished - 22 May 2023

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