Relationship between interlayer hardness and adhesion and pin-on-disc behaviour for fast atom beam source diamond-like-carbon films

B. Olliver, A. Matthews

Research output: Contribution to journalArticlepeer-review

Abstract

The effect of interlayers of Ti, and Ti(C,N) on the adhesion, hardness and friction coefficient of DLC films deposited using a Fast Atom Beam (FAB) source has been studied. Values obtained for DLC films on top of interlayers were compared with those of DLC films directly deposited on Co-Cr substrates by both the FAB source and RF CVD techniques. The scratch test adhesion of such coatings can be classified in the following ascending order: DLC/Ti, DLC/no interlayer, DLC/Ti(C,N). The sur-face composite hardness is greatly improved by a Ti(C,N) interlayer. However, DLC films deposited on Ti(C,N) failed during the pin-of-disc test whilst those on Ti and without an interlayer exhibited low friction coefficients and excellent wear performance. An explanation is developed in order to explain the causes of film failure during the pin-on-disc test. For a given interlayer hardness, an adhesion threshold is required to survive the pin-on-disc test. The higher the hardness, the greater the required adhesion threshold, as interfacial shear stresses induced by the pin-on-disc are greater for hard surfaces, due to the smaller contact area.

Original languageEnglish
Pages (from-to)725-735
Number of pages11
JournalJournal of Adhesion Science and Technology
Volume9
Issue number6
DOIs
Publication statusPublished - 1 Jan 1995

Keywords

  • Adhesion
  • DLC
  • Interlayer
  • Pin-on-disc

Fingerprint

Dive into the research topics of 'Relationship between interlayer hardness and adhesion and pin-on-disc behaviour for fast atom beam source diamond-like-carbon films'. Together they form a unique fingerprint.

Cite this