Residual stress trend in thermal barrier coatings in through thickness direction measured by photoluminescence piezospectroscopy

C. Chen, H. B. Guo, I. P. Shapiro, H. Peng, X. F. Zhao, P. Xiao*, S. K. Gong

*Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

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