Abstract
Beam-excited higher order modes (HOMs) can provide remote diagnostics information of the beam position and cavity misalignment. In this paper we report on recent studies on the resolution with specially selected series of modes with custom-built electronics. This constitutes the first report of measurements of these cavities in which we obtained a resolution of 20 micron in beam offset. Details of the setup of the electronics and HOM measurements are provided. © 2012 IOP Publishing Ltd and Sissa Medialab srl.
Original language | English |
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Article number | P11016 |
Journal | Journal of Instrumentation |
Volume | 7 |
Issue number | 11 |
DOIs | |
Publication status | Published - Nov 2012 |
Keywords
- Analysis and statistical methods
- beam-intensity monitors
- Beam-line instrumentation (beam position and profile monitors
- bunch length monitors)
- Data reduction methods