Resolution study of higher-order-mode-based beam position diagnostics using custom-built electronics in strongly coupled 3.9 GHz multi-cavity accelerating module

P. Zhang, N. Baboi, R. M. Jones, N. Eddy

    Research output: Contribution to journalArticlepeer-review

    Abstract

    Beam-excited higher order modes (HOMs) can provide remote diagnostics information of the beam position and cavity misalignment. In this paper we report on recent studies on the resolution with specially selected series of modes with custom-built electronics. This constitutes the first report of measurements of these cavities in which we obtained a resolution of 20 micron in beam offset. Details of the setup of the electronics and HOM measurements are provided. © 2012 IOP Publishing Ltd and Sissa Medialab srl.
    Original languageEnglish
    Article numberP11016
    JournalJournal of Instrumentation
    Volume7
    Issue number11
    DOIs
    Publication statusPublished - Nov 2012

    Keywords

    • Analysis and statistical methods
    • beam-intensity monitors
    • Beam-line instrumentation (beam position and profile monitors
    • bunch length monitors)
    • Data reduction methods

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