Resonances while surmounting a fluctuating barrier

J. Iwaniszewski, I. K. Kaufman, P. V E McClintock, A. J. McKane

    Research output: Contribution to journalArticlepeer-review


    Electronic analog experiments on escape over a fluctuating potential barrier are performed for the case when the fluctuations are caused by Ornstein-Uhlenbeck noise (OUN). In its dependence on the relation between the two OUN parameters (the correlation time τ and noise strength Q) the nonmonotonic variation of the mean escape time τ as a function of τ can exhibit either a minimum (resonant activation), or a maximum (inhibition of activation), or both these effects. The possible resonant nature of these features is discussed. We claim that τ is not a good quantity to describe the resonancelike character of the problem. Independently of the specific relation between the OUN parameters, the resonance manifests itself as a maximal lowering of the potential barrier during the escape event, and it appears for τ of the order of the relaxation time toward the metastable state.
    Original languageEnglish
    Pages (from-to)1170-1175
    Number of pages5
    JournalPhysical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics
    Issue number2
    Publication statusPublished - Feb 2000


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