Resonant x-ray emission spectroscopy at the L3 edge of americium up to 23 GPa

S. Heathman, J. P. Rueff, L. Simonelli, M. A. Denecke, J. C. Griveau, R. Caciuffo, G. H. Lander

Research output: Contribution to journal › Article › peer-review

13 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Resonant x-ray emission spectroscopy at the L3 edge of americium up to 23 GPa'. Together they form a unique fingerprint.

Engineering

Physics