Return of asynchronous logic

S. B. Furber

Return of asynchronous logic

S. B. Furber^*

^*Corresponding author for this work

Advanced Processor Technology

Research output: Chapter in Book/Conference proceeding › Conference contribution › peer-review

Abstract

Integrated circuits (ICs) based on asynchronous logic design are enjoying a resurgence as more and more circuit designers realize the advantages of this design concept over clock designs. Clock circuits waste power by clocking all parts of the chip and must be margined for worst case processes, unlike asynchronous logic ICs which allow optimum hardware concurrency and offers improve electromagnetic compatibility. However, production quality assurance techniques must first be enhanced to address the complexities involved in the testing of such circuits.

Original language	English
Title of host publication	IEEE International Test Conference (TC)
Publisher	IEEE
Pages	938
Number of pages	1
Publication status	Published - 1996
Event	Proceedings of the 1996 IEEE International Test Conference - Washington, DC, USA Duration: 20 Oct 1996 → 24 Oct 1996

Conference

Conference	Proceedings of the 1996 IEEE International Test Conference
City	Washington, DC, USA
Period	20/10/96 → 24/10/96

Cite this

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title = "Return of asynchronous logic",

abstract = "Integrated circuits (ICs) based on asynchronous logic design are enjoying a resurgence as more and more circuit designers realize the advantages of this design concept over clock designs. Clock circuits waste power by clocking all parts of the chip and must be margined for worst case processes, unlike asynchronous logic ICs which allow optimum hardware concurrency and offers improve electromagnetic compatibility. However, production quality assurance techniques must first be enhanced to address the complexities involved in the testing of such circuits.",

author = "Furber, \{S. B.\}",

year = "1996",

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booktitle = "IEEE International Test Conference (TC)",

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note = "Proceedings of the 1996 IEEE International Test Conference ; Conference date: 20-10-1996 Through 24-10-1996",

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N2 - Integrated circuits (ICs) based on asynchronous logic design are enjoying a resurgence as more and more circuit designers realize the advantages of this design concept over clock designs. Clock circuits waste power by clocking all parts of the chip and must be margined for worst case processes, unlike asynchronous logic ICs which allow optimum hardware concurrency and offers improve electromagnetic compatibility. However, production quality assurance techniques must first be enhanced to address the complexities involved in the testing of such circuits.

AB - Integrated circuits (ICs) based on asynchronous logic design are enjoying a resurgence as more and more circuit designers realize the advantages of this design concept over clock designs. Clock circuits waste power by clocking all parts of the chip and must be margined for worst case processes, unlike asynchronous logic ICs which allow optimum hardware concurrency and offers improve electromagnetic compatibility. However, production quality assurance techniques must first be enhanced to address the complexities involved in the testing of such circuits.

UR - https://www.scopus.com/pages/publications/0030398786

M3 - Conference contribution

AN - SCOPUS:0030398786

SP - 938

BT - IEEE International Test Conference (TC)

PB - IEEE

T2 - Proceedings of the 1996 IEEE International Test Conference

Y2 - 20 October 1996 through 24 October 1996

ER -

Return of asynchronous logic

Abstract

Conference

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