RF, Microwave & EMC Conf. Design, semimulation and measurement, EEEfCom

Conventionally used S-parameter methods do not offer complete performance characteristics especially when the component is used for digital applications. In this work eye diagrams have been used for the first time as a measurement tool to quantify the performance of both active and passive components. The eye diagrams, which have always been used as a mere visual tool in the past, here it has been shown as a very powerful tool, which helps in the optimization of components especially for use in optical applications. Eye diagrams have been generated, measured and also simulated for InGaP/GaAs HBTs at different frequency and temperature ranges. Various eye parameters have been extracted and it is observed that these can be related directly to the physics of device under test.