Sampling in x-ray ptychography

T. B. Edo, D. J. Batey, A. M. Maiden, C. Rau, U. Wagner, Z. D. Pešić, T. A. Waigh, J. M. Rodenburg

    Research output: Contribution to journalArticlepeer-review


    Coherent diffractive imaging (CDI) is a means of overcoming the resolution and image contrast limitations of electron and x-ray lenses. The central tenet of the method is that the intensity of the diffraction pattern must be measured on a sufficiently fine pixel pitch, which is inversely related to the size of the illuminated region of the object. We show here that ptychography - a form of CDI that uses many diffraction patterns - is not subject to this constraint. Using a variant of the ePIE inversion algorithm, we demonstrate experimentally that the sampling requirement in ptychography is independent of illumination size. © 2013 American Physical Society.
    Original languageEnglish
    Article number053850
    JournalPhysical Review A
    Issue number5
    Publication statusPublished - 30 May 2013


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